Yang, G., Yadid-Pecht, O., Wrigley, C., & Pain, B. (1998). A snap-shot CMOS active pixel imager for low-noise, high-speed imaging. International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217), Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International, Electron devices - IEDM 1998, 45-48. https://doi.org/10.1109/IEDM.1998.746243
Chicago Style (17th ed.) CitationYang, Guang, O. Yadid-Pecht, C. Wrigley, and B. Pain. "A Snap-shot CMOS Active Pixel Imager for Low-noise, High-speed Imaging." International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217), Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International, Electron Devices - IEDM 1998 1998: 45-48. https://doi.org/10.1109/IEDM.1998.746243.
MLA (8th ed.) CitationYang, Guang, et al. "A Snap-shot CMOS Active Pixel Imager for Low-noise, High-speed Imaging." International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217), Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International, Electron Devices - IEDM 1998, 1998, pp. 45-48, https://doi.org/10.1109/IEDM.1998.746243.