Handbook of metrology and applications / Dinesh K. Aswal, Sanjay Yadav, Toshiyuki Takatsuji, Prem Rachakonda, Harish Kumar, editors.
"This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency me...
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| Other Authors: | , , , , |
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| Format: | Ebook |
| Language: | English |
| Published: |
Singapore :
Springer,
2023.
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| Subjects: | |
| Online Access: | Springer eBooks |
MARC
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| 245 | 0 | 0 | |a Handbook of metrology and applications / |c Dinesh K. Aswal, Sanjay Yadav, Toshiyuki Takatsuji, Prem Rachakonda, Harish Kumar, editors. |
| 246 | 1 | 0 | |a metrology and applications |
| 264 | 1 | |a Singapore : |b Springer, |c 2023. | |
| 300 | |a 1 online resource (xlii, 2486 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a Description based upon print version of record. | ||
| 505 | 0 | 0 | |t 3D Imaging Systems for Optical Metrology / |r Marc-Antoine Drouin, Antoine Tahan -- |t Accreditation in the Life of General Citizen of India / |r Battal Singh -- |t Additive Manufacturing Metrology / |r Mansi, Harish Kumar, A. K. S. Singholi -- |t Additive Manufacturing: A Brief Introduction / |r Mansi, Harish Kumar, A. K. S. Singholi, Girija Moona -- |t Advanced Techniques in Evaluation of Measurement Uncertainty / |r N. Garg, V. Ramnath, S. Yadav -- |t Advancements in Measuring Cognition Using EEG and fNIRS / |r Sushil Chandra, Abhinav Choudhury -- |t Advances in Additive Manufacturing and Its Numerical Modelling / |r Shadab Ahmad, Shanay Rab, Hargovind Soni -- |t Alloys as Certified Reference Materials (CRMs) / |r Nirmalya Karar, Vipin Jain -- |t An Insight on Quality Infrastructure / |r Shanay Rab, Sanjay Yadav, Meher Wan, D. K. Aswal -- |t Antennas for mm-wave MIMO RADAR / |r Jogesh Chandra Dash, Debdeep Sarkar -- |t Application of Contemporary Techniques of Evaluation of Measurement Uncertainty in Pressure Transducer / |r Shanay Rab, Jasveer Singh, Afaqul Zafer, Nita Dilawar Sharma, Sanjay Yadav -- |t Artificial Intelligence / |r Kirti Soni, Nishant Kumar, Anjali S. Nair, Parag Chourey, Nirbhow Jap Singh, Ravinder Agarwal -- |t Artificial Intelligence for Iris-Based Diagnosis in Healthcare / |r Ravinder Agarwal, Piyush Samant, Atul Bansal, Rohit Agarwal -- |t Assessment and Elimination of Surgeon Hand Tremor During Robotic Surgery / |r Amod Kumar, Sanjeev Kumar, Akhlesh Kumar -- |t Atomic Frequency Standards / |r Poonam Arora, Amitava Sen Gupta -- |t Atomic Timescales / |r J. M. López-Romero, C. A. Ortiz-Cardona -- |t Bharatiya Nirdeshak Dravya for Antibiotics and Pesticide / |r Arvind Gautam, Nahar Singh -- |t Bharatiya Nirdeshak Dravya for Assessing Mechanical Properties / |r V. Ezhilselvi, V. N. Singh, Umesh Gupta, S. S. K. Titus, Nahar Singh -- |t Calibration of Snow and Met Sensors for Avalanche Forecasting / |r Neeraj Sharma -- |t Certified Reference Material for Qualifying Biomaterials in Biological Evaluations / |r N. S. Remya, Leena Joseph -- |t Certified Reference Materials (CRMs) / |r Nahar Singh -- |t CRMs / |r S. K. Shaw, Amit Trivedi, V. Naga Kumar, Abhishek Agnihotri, B. N. Mohapatra, Ezhilselvi Varathan et al. -- |t Development of Calibrated and Validated SODAR with Reference of Air Quality Management / |r Kirti Soni, Anjali S. Nair, Nishant Kumar, Parag Chourey, Nirbhow Jap Singh, Ravinder Agarwal -- |t Electromagnetic Metrology for Microwave Absorbing Materials / |r Naina Narang, Anshika Verma, Jaydeep Singh, Dharmendra Singh -- |t Environmental Metrology / |r Ravinder Agarwal, Susheel Mittal -- |t Equipment for Environmental Radioactivity Measurement: Calibration and Traceability / |r Manish K. Mishra, A. Vinod Kumar -- |t Evaluation and Analysis of Measurement Uncertainty / |r H. Gupta, Shanay Rab, N. Garg -- |t Fusion of Smart Meteorological Sensors, Remote Sensing Techniques, and IoT in Context of Industry 4.0 / |r Kirti Soni, Parag Chourey, Nishant Kumar, Nirbhow Jap Singh, Ravinder Agarwal, Anjali S. Nair -- |t Glucose Monitoring Techniques and Their Calibration / |r Deepshikha Yadav, Surinder P. Singh, P. K. Dubey -- |t Hardness Metrology / |r Riham Hegazy -- |t Importance of Ultrasonic Testing and Its Metrology Through Emerging Applications / |r Kalpana Yadav, Sanjay Yadav, P. K. Dubey -- |t Indian Reference Materials for Calibration of Sophisticated Instruments / |r N. Vijayan, Pallavi Kushwaha, Asit Patra, Rachana Kumar, Surinder Pal Singh, Sandeep Singh et al. -- |t Industrial Metrology / |r Sanjay Yadav, Shanay Rab, S. K. Jaiswal, Ashok Kumar, D. K. Aswal -- |t Instruments for Monitoring Air Pollution and Air Quality / |r S. K. Gupta, Balbir Singh -- |t International and National Metrology / |r Shanay Rab, Meher Wan, Sanjay Yadav -- |t Legal Metrology and Global Trade / |r G. R. Srikkanth -- |t Machine Learning in Neuromuscular Disease Classification / |r Niveen Farid -- |t Measurement Uncertainty / |r C. V. Rao -- |t Measurements of Indoor Air Quality / |r Atar Singh Pipal, Ajay Taneja -- |t Mechanical and Thermo-physical Properties of Rare-Earth Materials / |r Vyoma Bhalla, Devraj Singh -- |t Metrological Aspects of Blood Pressure Measurement / |r Rahul Kumar, P. K. Dubey, Sanjay Yadav -- |t Metrological Aspects of SEMG Signal Acquisition, Processing, and Application Design / |r Rohit Gupta, Inderjeet Singh Dhindsa, Ravinder Agarwal -- |t Metrological Assessments in Additive Manufacturing / |r Meena Pant, Girija Moona, Leeladhar Nagdeve, Harish Kumar -- |t Metrological Concepts for Ionizing Radiation in Medical Applications / |r Hala Ahmed Soliman -- |t Microscopy Using Liquid Lenses for Industrial and Biological Applications / |r Neelam Barak, Vineeta Kumari, Gyanendra Sheoran -- |t Modern Approaches to Statistical Estimation of Measurements in the Location Model and Regression / |r Jan Kalina, Petra Vidnerová, Lubomír Soukup -- |t Monte Carlo Simulations in Uncertainty Evaluation for Partial Differential Equations / |r Vishal Ramnath -- |t Necessity of Anatomically Real Numerical Phantoms in Optical Metrology / |r Vineeta Kumari, Neelam Barak, Gyanendra Sheoran -- |t Nuclear Forensics: Role of Radiation Metrology / |r S. Mishra, S. Anilkumar, A. Vinod Kumar -- |t Occupational Radiation Monitoring in Indian Nuclear Industry / |r M. K. Sureshkumar, M. S. Kulkarni -- |t Optical Dimensional Metrology / |r Arif Sanjid Mahammad, K. P. Chaudhary -- |t Optical Frequency Comb / |r Mukesh Jewariya -- |t Particulate Matter Measurement Techniques / |r Kritika Shukla, Shankar G. Aggarwal -- |t Petroleum-Based Indian Reference Materials (BND) / |r G. A. Basheed, S. S. Tripathy, Nahar Singh, Vidya Nand Singh, Arvind Gautam, Dosodia Abhishek et al. -- |t Phased Array Antenna for Radar Application / |r Ashutosh Kedar -- |t Physical Quantities of Sound and Expanding Demands for Noise Measurement / |r Hironobu Takahashi, Keisuke Yamada, Ryuzo Horiuchi -- |t Precious Metals-Bharatiya Nirdeshak Dravya for Pure and Sure Jewelry / |r V. N. Singh, Dinesh Singh, Pallavi Kushwaha, Ishwar Jalan, Nahar Singh -- |t Precise Time and Frequency Transfer: Techniques / |r Huang-Tien Lin -- |t Precise Time Transfer Techniques – Part I / |r Pranalee Premdas Thorat, Ravinder Agarwal, D. K. Aswal -- |t Precision Measurements in Healthcare Systems and Devices / |r Ravinder Agarwal, Amod Kumar, Sanjay Yadav -- |t Pressure and Its Measurement / |r Vinay Kumar -- |t Progress of Quantum Hall Research for Disseminating the Redefined SI / |r Albert F. Rigosi, Mattias Kruskopf, Alireza R. Panna, Shamith U. Payagala, Dean G. Jarrett, Randolph E. Elmquist et al. -- |t Quality Measurements and Relevant Indian Infrastructure / |r Anuj Bhatnagar, Shanay Rab, Meher Wan, Sanjay Yadav -- |t Quality: Introduction, Relevance, and Significance for Economic Growth / |r Alok Jain, Shanay Rab, Sanjay Yadav, Prapti Singh -- |t Quantum Definition of New Kelvin and Way Forward / |r Babita, Umesh Pant, D. D. Shivagan -- |t Quantum Microwave Measurements / |r Yashika Aneja, Monika Thakran, Asheesh Kumar Sharma, Harish Singh Rawat, Satya Kesh Dubey -- |t Quantum Pascal Realization from Refractometry / |r Vikas N. Thakur, Sanjay Yadav, Ashok Kumar -- |t Quantum Redefinition of Mass / |r Bushra Ehtesham, Thomas John, H. K. Singh, Nidhi Singh -- |t Radar Cross-Section (RCS) Estimation and Reduction / |r Vineetha Joy, Hema Singh -- |t Radiation Dosimetry / |r Subhalaxmi Mishra, T. Palani Selvam -- |t Radiation Metrology and Applications / |r V. Sathian, Probal Chaudhury -- |t Realization of Candela / |r Shibu Saha, Vijeta Jangra, V. K. Jaiswal, Parag Sharma -- |t Realization of the New Kilogram Based on the Planck Constant by the X-Ray Crystal Density Method / |r Naoki Kuramoto -- |t Recent Trends and Diversity in Ultrasonics / |r Deepa Joshi, D. S. Mehta -- |t Relevance of Radiometric Metrology in NORM Industries and Radiological Safety / |r S. K. Jha, S. K. Sahoo, M. S. Kulkarni, D. K. Aswal -- |t Role of Certified Reference Materials (CRMs) in Standardization, Quality Control, and Quality Assurance / |r S. K. Breja -- |t Role of IoT in Smart Precision Agriculture / |r Kumar Gaurav Suman, Dilip Kumar -- |t Role of Metrology in the Advanced Manufacturing Processes / |r Meena Pant, Girija Moona, Leeladhar Nagdeve, Harish Kumar -- |
| 505 | 8 | 0 | |t Sanctity of Calibrations: Vital for the Export of Indian Products / |r Anil Jain -- |t Soft Metrology / |r Marcela Vallejo, Nelson Bahamón, Laura Rossi, Edilson Delgado-Trejos -- |t Speckle Metrology in Dimensional Measurement / |r Niveen Farid -- |t Standardization and Regulatory Ecosystem in India / |r Bharat Kumar Yadav -- |t Strategies and Implications of Noise Pollution Monitoring, Modelling, and Mitigation in Urban Cities / |r S. K. Tiwari, L. A. Kumaraswamidhas, N. Garg -- |t The Mole and the New System of Units (SI) / |r Axel Pramann, Olaf Rienitz, Bernd Güttler -- |t The Quantifying of Uncertainty in Measurement / |r Ahmed A. Hawam -- |t The Quantum Reform of the International System of Units / |r William D. Phillips, Peter J. Mohr -- |t Time and Frequency Metrology / |r Poonam Arora, Amitava Sen Gupta -- |t Time Transfer via GNSS / |r P. Banerjee -- |t Torque Metrology / |r Koji OGUSHI, Atsuhiro NISHINO -- |t Traceability in Analytical Environmental Measurements / |r Shweta Singh, Monika J. Kulshrestha, Nisha Rani -- |t Traceable Synchrophasor Data for Smart Grid Metrology and Its Application in Protection and Control / |r Avni Khatkar, Saood Ahmad -- |t Use of Metrological Characteristics in Ultrasound Imaging and Artificial Intelligence Techniques for Disease Prediction in Soft Tissue Organs / |r Kriti, Ravinder Agarwal -- |t Using AI in Dimensional Metrology / |r Arif Sanjid Mahammad -- |t Wake-Up India to Build Self-Reliant Metrology Structure for Modern India / |r R. Sadananda Murthy. |
| 520 | |a "This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields."--Publisher's website. | ||
| 588 | |a RDA encoding generated via machine conversion from non-ISBD record. | ||
| 650 | 0 | |a Physical measurements. |9 322319 | |
| 700 | 1 | |a Aswal, Dinesh K., |e editor. |9 269357 | |
| 700 | 1 | |a Yadav, Sanjay, |c (Editor of Recent advances in metrology), |e editor. | |
| 700 | 1 | |a Takatsuji, Toshiyuki, |e editor. | |
| 700 | 1 | |a Rachakonda, Prem, |e editor. | |
| 700 | 1 | |a Kumar, Harish, |e editor. |9 1011622 | |
| 776 | 0 | 8 | |i Print version: |a Aswal, Dinesh K. |t Handbook of Metrology and Applications |d Singapore : Springer,c2023 |z 9789819920730 |
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