Handbook of metrology and applications / Dinesh K. Aswal, Sanjay Yadav, Toshiyuki Takatsuji, Prem Rachakonda, Harish Kumar, editors.

"​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency me...

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Bibliographic Details
Other Authors: Aswal, Dinesh K. (Editor), Yadav, Sanjay, (Editor of Recent advances in metrology) (Editor), Takatsuji, Toshiyuki (Editor), Rachakonda, Prem (Editor), Kumar, Harish (Editor)
Format: Ebook
Language:English
Published: Singapore : Springer, 2023.
Subjects:
Online Access:Springer eBooks

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245 0 0 |a Handbook of metrology and applications /  |c Dinesh K. Aswal, Sanjay Yadav, Toshiyuki Takatsuji, Prem Rachakonda, Harish Kumar, editors. 
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338 |a online resource  |b cr  |2 rdacarrier 
500 |a Description based upon print version of record. 
505 0 0 |t Metrology and Quality Infrastructure: --  |t International and National Metrology /  |r Shanay Rab, Meher Wan, Sanjay Yadav --  |t Wake-Up India to Build Self-Reliant Metrology Structure for Modern India /  |r R. Sadananda Murthy --  |t Quality: Introduction, Relevance, and Significance for Economic Growth /  |r Alok Jain, Shanay Rab, Sanjay Yadav, Prapti Singh --  |t Accreditation in the Life of General Citizen of India /  |r Battal Singh --  |t Quality Measurements and Relevant Indian Infrastructure /  |r Anuj Bhatnagar, Shanay Rab, Meher Wan, Sanjay Yadav --  |t An Insight on Quality Infrastructure /  |r Shanay Rab, Sanjay Yadav, Meher Wan, Dinesh K. Aswal --  |t Redefinition of SI Units and Its Implications: --  |t The Quantum Reform of the International System of Units /  |r William D. Phillips, Peter J. Mohr --  |t Realization of the New Kilogram Based on the Planck Constant by the X-Ray Crystal Density Method /  |r Naoki Kuramoto --  |t Quantum Redefinition of Mass /  |r Bushra Ehtesham, Thomas John, H. K. Singh, Nidhi Singh --  |t Optical Frequency Comb /  |r Mukesh Jewariya --  |t Quantum Definition of New Kelvin and Way Forward /  |r Babita, Umesh Pant, D. D. Shivagan --  |t Realization of Candela /  |r Shibu Saha, Vijeta Jangra, V. K. Jaiswal, Parag Sharma --  |t The Mole and the New System of Units (SI) /  |r Axel Pramann, Olaf Rienitz, Bernd Güttler --  |t Progress of Quantum Hall Research for Disseminating the Redefined SI /  |r Albert F. Rigosi, Mattias Kruskopf, Alireza R. Panna, Shamith U. Payagala, Dean G. Jarrett, Randolph E. Elmquist et al. --  |t Quantum Pascal Realization from Refractometry /  |r Vikas N. Thakur, Sanjay Yadav, Ashok Kumar --  |t Applications of Time and Frequency Metrology: --  |t Time and Frequency Metrology /  |r Poonam Arora, Amitava Sen Gupta --  |t Atomic Timescales /  |r J. M. López-Romero, C. A. Ortiz-Cardona --  |t Atomic Frequency Standards /  |r Poonam Arora, Amitava Sen Gupta --  |t Precise Time Transfer Techniques: Part I /  |r Pranalee Premdas Thorat, Ravinder Agarwal, Dinesh K. Aswal --  |t Time Transfer via GNSS /  |r P. Banerjee --  |t Precise Time and Frequency Transfer: Techniques /  |r Huang-Tien Lin --  |t Certified Reference Materials/Bharatiya Nirdeshak Dravya (BND): Need and Boon for Atma Nirbhar Bharat: --  |t Certified Reference Materials (CRMs) /  |r Nahar Singh --  |t Bharatiya Nirdeshak Dravya for Antibiotics and Pesticide /  |r Arvind Gautam, Nahar Singh --  |t Bharatiya Nirdeshak Dravya for Assessing Mechanical Properties /  |r Ezhilselvi Varathan, Vidya Nand Singh, Umesh Gupta, S. S. K. Titus, Nahar Singh --  |t Role of Certified Reference Materials (CRMs) in Standardization, Quality Control, and Quality Assurance /  |r S. K. Breja --  |t Precious Metals: Bharatiya Nirdeshak Dravya for Pure and Sure Jewelry /  |r Vidya Nand Singh, Dinesh Singh, Pallavi Kushwaha, Ishwar Jalan, Nahar Singh --  |t Indian Reference Materials for Calibration of Sophisticated Instruments /  |r N. Vijayan, Pallavi Kushwaha, Asit Patra, Rachana Kumar, Surinder Pal Singh, Sandeep Singh et al. --  |t Certified Reference Material for Qualifying Biomaterials in Biological Evaluations /  |r N. S. Remya, Leena Joseph --  |t Alloys as Certified Reference Materials (CRMs) /  |r Nirmalya Karar, Vipin Jain --  |t CRMs /  |r S. K. Shaw, Amit Trivedi, V. Naga Kumar, Abhishek Agnihotri, B. N. Mohapatra, Ezhilselvi Varathan et al. --  |t Petroleum-Based Indian Reference Materials (BND) /  |r G. A. Basheed, S. S. Tripathy, Nahar Singh, Vidya Nand Singh, Arvind Gautam, Dosodia Abhishek et al. --  |t Industrial Metrology: Opportunities and Challenges: --  |t Industrial Metrology /  |r Sanjay Yadav, Shanay Rab, S. K. Jaiswal, Ashok Kumar, Dinesh K. Aswal --  |t Importance of Ultrasonic Testing and Its Metrology Through Emerging Applications /  |r Kalpana Yadav, Sanjay Yadav, P. K. Dubey --  |t Mechanical and Thermo-physical Properties of Rare-Earth Materials /  |r Vyoma Bhalla, Devraj Singh --  |t Hardness Metrology /  |r Riham Hegazy --  |t Torque Metrology /  |r Koji Ogushi, Atsuhiro Nishino --  |t Recent Trends and Diversity in Ultrasonics /  |r Deepa Joshi, D. S. Mehta --  |t Calibration of Snow and Met Sensors for Avalanche Forecasting /  |r Neeraj Sharma --  |t Pressure and Its Measurement /  |r Vinay Kumar --  |t Traceable Synchrophasor Data for Smart Grid Metrology and Its Application in Protection and Control /  |r Avni Khatkar, Saood Ahmad --  |t Industry 4.0 and Engineering Metrology: A Perspective: --  |t Using AI in Dimensional Metrology /  |r Arif Sanjid Mahammad --  |t Artificial Intelligence /  |r Kirti Soni, Nishant Kumar, Anjali S. Nair, Parag Chourey, Nirbhow Jap Singh, Ravinder Agarwal --  |t Fusion of Smart Meteorological Sensors, Remote Sensing Techniques, and IoT in Context of Industry 4.0 /  |r Kirti Soni, Parag Chourey, Nishant Kumar, Nirbhow Jap Singh, Ravinder Agarwal, Anjali S. Nair --  |t Machine Learning in Neuromuscular Disease Classification /  |r Niveen Farid --  |t Metrology in Additive Manufacturing: Present Scenario and Challenges: --  |t Role of Metrology in the Advanced Manufacturing Processes /  |r Meena Pant, Girija Moona, Leeladhar Nagdeve, Harish Kumar --  |t Additive Manufacturing: A Brief Introduction /  |r Mansi, Harish Kumar, A. K. S. Singholi, Girija Moona --  |t Additive Manufacturing Metrology /  |r Mansi, Harish Kumar, A. K. S. Singholi --  |t Metrological Assessments in Additive Manufacturing /  |r Meena Pant, Girija Moona, Leeladhar Nagdeve, Harish Kumar --  |t Advances in Additive Manufacturing and Its Numerical Modelling /  |r Shadab Ahmad, Shanay Rab, Hargovind Soni --  |t Digital Transformations in Metrology: A Pathway for Future: --  |t Role of IoT in Smart Precision Agriculture /  |r Kumar Gaurav Suman, Dilip Kumar --  |t Soft Metrology /  |r Marcela Vallejo, Nelson Bahamón, Laura Rossi, Edilson Delgado-Trejos --  |t Optical Dimensional Metrology /  |r Arif Sanjid Mahammad, K. P. Chaudhary --  |t 3D Imaging Systems for Optical Metrology /  |r Marc-Antoine Drouin, Antoine Tahan --  |t Speckle Metrology in Dimensional Measurement /  |r Niveen Farid --  |t Necessity of Anatomically Real Numerical Phantoms in Optical Metrology /  |r Vineeta Kumari, Neelam Barak, Gyanendra Sheoran --  |t Microscopy Using Liquid Lenses for Industrial and Biological Applications /  |r Neelam Barak, Vineeta Kumari, Gyanendra Sheoran --  |t Metrology for Advanced Communication: --  |t Quantum Microwave Measurements /  |r Yashika Aneja, Monika Thakran, Asheesh Kumar Sharma, Harish Singh Rawat, Satya Kesh Dubey --  |t Electromagnetic Metrology for Microwave Absorbing Materials /  |r Naina Narang, Anshika Verma, Jaydeep Singh, Dharmendra Singh --  |t Phased Array Antenna for Radar Application /  |r Ashutosh Kedar --  |t Antennas for mm-wave MIMO RADAR /  |r Jogesh Chandra Dash, Debdeep Sarkar --  |t Radar Cross-Section (RCS) Estimation and Reduction /  |r Vineetha Joy, Hema Singh --  |t Environmental Metrology: --  |t Environmental Metrology /  |r Ravinder Agarwal, Susheel Mittal --  |t Physical Quantities of Sound and Expanding Demands for Noise Measurement /  |r Hironobu Takahashi, Keisuke Yamada, Ryuzo Horiuchi --  |t Strategies and Implications of Noise Pollution Monitoring, Modelling, and Mitigation in Urban Cities /  |r S. K. Tiwari, L. A. Kumaraswamidhas, N. Garg --  |t Development of Calibrated and Validated SODAR with Reference of Air Quality Management /  |r Kirti Soni, Anjali S. Nair, Nishant Kumar, Parag Chourey, Nirbhow Jap Singh, Ravinder Agarwal --  |t Measurements of Indoor Air Quality /  |r Atar Singh Pipal, Ajay Taneja --  |t Instruments for Monitoring Air Pollution and Air Quality /  |r S. K. Gupta, Balbir Singh --  |t Traceability in Analytical Environmental Measurements /  |r Shweta Singh, Monika J. Kulshrestha, Nisha Rani --  |t Particulate Matter Measurement Techniques /  |r Kritika Shukla, Shankar G. Aggarwal --  |t Metrology in Bio-medical Engineering: --  |t Precision Measurements in Healthcare Systems and Devices /  |r Ravinder Agarwal, Amod Kumar, Sanjay Yadav --  |t Assessment and Elimination of Surgeon Hand Tremor During Robotic Surgery /  |r Amod Kumar, Sanjeev Kumar, Akhlesh Kumar --  |t Metrological Aspects of Blood Pressure Measurement /  |r Rahul Kumar, P. K. Dubey, Sanjay Yadav --  |t Glucose Monitoring Techniques and Their Calibration /  |r Deepshikha Yadav, Surinder Pal Singh, P. K. Dubey --  |t Advancements in Measuring Cognition Using EEG and fNIRS /  |r Sushil Chandra, Abhinav Choudhury -- 
505 8 0 |t Metrological Aspects of SEMG Signal Acquisition, Processing, and Application Design /  |r Rohit Gupta, Inderjeet Singh Dhindsa, Ravinder Agarwal --  |t Artificial Intelligence for Iris-Based Diagnosis in Healthcare /  |r Ravinder Agarwal, Piyush Samant, Atul Bansal, Rohit Agarwal --  |t Use of Metrological Characteristics in Ultrasound Imaging and Artificial Intelligence Techniques for Disease Prediction in Soft Tissue Organs /  |r Kriti, Ravinder Agarwal --  |t Legal Metrology and Global Trade: --  |t Legal Metrology and Global Trade /  |r G. R. Srikkanth --  |t Standardization and Regulatory Ecosystem in India /  |r Bharat Kumar Yadav --  |t Sanctity of Calibrations /  |r Anil Jain --  |t Radiation Metrology and National Standards: --  |t Radiation Dosimetry /  |r Subhalaxmi Mishra, T. Palani Selvam --  |t Equipment for Environmental Radioactivity Measurement: Calibration and Traceability /  |r Manish K. Mishra, A. Vinod Kumar --  |t Radiation Metrology and Applications /  |r V. Sathian, Probal Chaudhury --  |t Occupational Radiation Monitoring in Indian Nuclear Industry /  |r M. K. Sureshkumar, M. S. Kulkarni --  |t Relevance of Radiometric Metrology in NORM Industries and Radiological Safety /  |r S. K. Jha, S. K. Sahoo, M. S. Kulkarni, Dinesh K. Aswal --  |t Metrological Concepts for Ionizing Radiation in Medical Applications /  |r Hala Ahmed Soliman --  |t Nuclear Forensics: Role of Radiation Metrology /  |r S. Mishra, S. Anilkumar, A. Vinod Kumar --  |t Advanced Techniques in Evaluation of Measurement Uncertainty: --  |t Advanced Techniques in Evaluation of Measurement Uncertainty /  |r N. Garg, Vishal Ramnath, Sanjay Yadav --  |t Monte Carlo Simulations in Uncertainty Evaluation for Partial Differential Equations /  |r Vishal Ramnath --  |t Modern Approaches to Statistical Estimation of Measurements in the Location Model and Regression /  |r Jan Kalina, Petra Vidnerová, Lubomír Soukup --  |t The Quantifying of Uncertainty in Measurement /  |r Ahmed A. Hawam --  |t Measurement Uncertainty /  |r C. V. Rao --  |t Evaluation and Analysis of Measurement Uncertainty /  |r H. Gupta, Shanay Rab, N. Garg --  |t Application of Contemporary Techniques of Evaluation of Measurement Uncertainty in Pressure Transducer /  |r Shanay Rab, Jasveer Singh, Afaqul Zafer, Nita Dilawar Sharma, Sanjay Yadav. 
520 |a "​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields."--Publisher's website. 
588 |a RDA encoding generated via machine conversion from non-ISBD record. 
650 0 |a Physical measurements.  |9 322319 
700 1 |a Aswal, Dinesh K.,  |e editor.  |9 269357 
700 1 |a Yadav, Sanjay,  |c (Editor of Recent advances in metrology),  |e editor. 
700 1 |a Takatsuji, Toshiyuki,  |e editor. 
700 1 |a Rachakonda, Prem,  |e editor. 
700 1 |a Kumar, Harish,  |e editor.  |9 1011622 
776 0 8 |i Print version:  |a Aswal, Dinesh K.  |t Handbook of Metrology and Applications  |d Singapore : Springer,c2023  |z 9789819920730 
856 4 0 |u https://ezproxy.aut.ac.nz/login?url=https://link.springer.com/10.1007/978-981-99-2074-7  |z Springer eBooks  |x TEMPORARY ERM URL 
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