Academic Journal
Analysis of the Root Causes of Damage to the Edges of Tank Manholes on the Main Deck of Handy-Size Bulk Carriers.
| Title: | Analysis of the Root Causes of Damage to the Edges of Tank Manholes on the Main Deck of Handy-Size Bulk Carriers. |
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| Authors: | Chybowski, Leszek, Gawdzińska, Katarzyna, Pokluda, Jaroslav |
| Source: | Materials (1996-1944); 2/1/2021, Vol. 14 Issue 3, p632, 1p |
| Abstract: | This study analyzes the root causes of cracks in the deck plating around tank manholes. Four handy-size bulk carriers built in one shipyard were analyzed. In all cases, deck cracks were found near manholes, and the average time from the commencement of operation until the occurrence of cracks was 1356 days. Due to this short wear-life of the vessel's structural material, the authors believed that it was unlikely to be caused by corrosion fatigue. The authors hypothesized that main decks cracked around manholes because of very poor-quality welded joints and poor-quality steel (large amounts of non-metallic impurities) used to make the manholes. In order to verify this hypothesis, on each of the vessels, material samples were collected from near the cracks and then examined thoroughly. Each sample was subjected to the macroscopic examination of the natural surfaces of cracks and their vicinity, microscopic examination of the material, mechanical property tests, and scanning electron microscope fractography for samples obtained after impact tests. The examination and test results were used to draw detailed conclusions for each case study. The general conclusions based on examination of the whole damage population validated the authors' hypothesis that main decks cracked around manholes because of very poor-quality welded joints and poor-quality steel used to make the manholes. [ABSTRACT FROM AUTHOR] |
| Subject Terms: | ROOT cause analysis, CORROSION fatigue, SCANNING electron microscopes, CONSTRUCTION materials, IMPACT testing, SURFACE cracks |
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| ISSN: | 19961944 |
| DOI: | 10.3390/ma14030632 |
| Database: | Complementary Index |
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