Academic Journal
Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient
| Title: | Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient |
|---|---|
| Authors: | Shi, Z., Xiao, J., Jiang, J., Zhang, Y., Zhou, Y. |
| Source: | IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(4):2319-2323 Apr, 2024 |
| ISSN: | 1549774715583791 |
| DOI: | 10.1109/TCSII.2023.3334390 |
| Database: | IEEE Xplore Digital Library |