Conference
Microwave Imaging for Brain Cancer Detection: Enhanced Accuracy with Machine Learning Approach
| Title: | Microwave Imaging for Brain Cancer Detection: Enhanced Accuracy with Machine Learning Approach |
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| Authors: | Costanzo, Sandra, Flores, Alexandra, Buonanno, Giovanni |
| Source: | 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :519-524 Oct, 2023 |
| Relation: | 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) |
| DOI: | 10.1109/MetroXRAINE58569.2023.10405677 |
| Database: | IEEE Xplore Digital Library |