Conference

Flight Test Data Extraction Based on Clustering Analysis

Bibliographic Details
Title: Flight Test Data Extraction Based on Clustering Analysis
Authors: Yue, Jian, Zhu, Pan, Yan, Lijun
Source: 2023 3rd International Conference on Electronic Information Engineering and Computer Science (EIECS) Electronic Information Engineering and Computer Science (EIECS), 2023 3rd International Conference on. :351-354 Sep, 2023
Relation: 2023 3rd International Conference on Electronic Information Engineering and Computer Science (EIECS)
DOI: 10.1109/EIECS59936.2023.10435504
Database: IEEE Xplore Digital Library