Conference
TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFET Devices
| Title: | TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFET Devices |
|---|---|
| Authors: | Neuendank, Jereme, Al Mamun, Fahad, Barnaby, Hugh, Bonaldo, Stefano, Spear, Matthew, Wallace, Trace, Loveless, Daniel, Pew, Jacob, Nour, Mohamed, Manos, Pete, Giorno, Zach, Suriono, Usman, Chambers, Mike, Kosier, Steve |
| Source: | 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-5 Oct, 2023 |
| Relation: | 2023 IEEE International Integrated Reliability Workshop (IIRW) |
| ISSN: | 23748036 |
| DOI: | 10.1109/IIRW59383.2023.10477707 |
| Database: | IEEE Xplore Digital Library |