Conference
Transistor Matrix Array for Measuring Variability and Random Telegraph Noise at Cryogenic Temperatures
| Title: | Transistor Matrix Array for Measuring Variability and Random Telegraph Noise at Cryogenic Temperatures |
|---|---|
| Authors: | Mizutani, Tomoko, Takeuchi, Kiyoshi, Saraya, Takuya, Oka, Hiroshi, Mori, Takahiro, Kobayashi, Masaharu, Hiramoro, Toshiro |
| Source: | 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024 |
| Relation: | 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) |
| ISSN: | 21581029 |
| DOI: | 10.1109/ICMTS59902.2024.10520700 |
| Database: | IEEE Xplore Digital Library |