Conference
Switching behavior of the soft breakdown conduction characteristic in ultra-thin (
| Title: | Switching behavior of the soft breakdown conduction characteristic in ultra-thin ( |
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| Authors: | Miranda, E., Sune, J., Rodriguez, R., Nafria, M., Aymerich, X. |
| Source: | 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) Reliability physics Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International. :42-46 1998 |
| Relation: | 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual |
| DOI: | 10.1109/RELPHY.1998.670440 |
| Database: | IEEE Xplore Digital Library |