Conference

A high performance 3.97 /spl mu/m/sup 2/ CMOS SRAM technology using self-aligned local interconnect and copper interconnect metallization

Bibliographic Details
Title: A high performance 3.97 /spl mu/m/sup 2/ CMOS SRAM technology using self-aligned local interconnect and copper interconnect metallization
Authors: Woo, M., Bhat, M., Craig, M., Kenkare, P., Wnag, X., Tolic, F., Chuang, H., Parihar, S., Schmidt, J., Terpolilli, L., Pena, R., Derr, D., Cave, N., Crabtree, P., Capetillo, M., Filipiak, S., Lii, T., Nagy, A., O'Meara, D., Vuong, T., Blackwell, M., Larson, R., Wilson, M., Hayden, J., Venkatesan, S., Tsui, P., Gilbert, P., Perera, A., Subramanian, C., McNelly, T., Misra, V., Islam, R., Smith, B., Farkas, J., Watts, D., Denning, D., Garcia, S., Frisa, L., Iyer, S., Lage, C.
Source: 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) VLSI technology VLSI Technology, 1998. Digest of Technical Papers. 1998 Symposium on. :12-13 1998
Relation: 1998 Symposium on VLSI Technology Digest of Technical Papers
DOI: 10.1109/VLSIT.1998.689179
Database: IEEE Xplore Digital Library