Conference
Model Based JUnit Testing
| Title: | Model Based JUnit Testing |
|---|---|
| Authors: | Gromov, Maxim L., Prokopenko, Svetlana A., Shabaldina, Natalia V., Laputenko, Andrey V. |
| Source: | 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Micro/Nanotechnologies and Electron Devices (EDM), 2019 20th International Conference of Young Specialists on. :139-142 Jun, 2019 |
| Relation: | 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) |
| ISSN: | 2325419X |
| DOI: | 10.1109/EDM.2019.8823472 |
| Database: | IEEE Xplore Digital Library |