The core test wrapper handbook : rationale and application of IEEE std. 1500 / by Francisco da Silva, Teresa McLaurin, Tom Waayers.

"In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on...

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Bibliographic Details
Main Author: Da Silva, Francisco
Corporate Author: SpringerLink ebooks - Engineering (2006)
Other Authors: McLaurin, Teresa, Waayers, Tom
Format: Ebook
Language:English
Published: New York, NY : Springer, c2006.
Series:Frontiers in electronic testing ; 35.
Subjects:
Online Access:Springer eBooks
Description
Summary:"In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion – a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either."--Publisher's website.
Item Description:Includes index.
Format:Mode of access: World Wide Web.
ISBN:0387346090
1280619236
9780387346090
9781280619236
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