Functional design errors in digital circuits : diagnosis, correction and repair / Kai-hui Chang, Igor L. Markov, Valeria Bertacco.

"Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace...

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Bibliographic Details
Main Author: Chang, Kai-hui
Corporate Author: SpringerLink ebooks - Engineering (2009)
Other Authors: Bertacco, Valeria, Markov, Igor L. (Igor Leonidovich), 1973-
Format: Ebook
Language:English
Published: [Dordrecht?] : Springer, c2009.
Series:Lecture notes in electrical engineering ; v. 32.
Subjects:
Online Access:Springer eBooks
Description
Summary:"Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices."--Publisher's website.
Format:Mode of access: World Wide Web.
Bibliography:Includes bibliographical references (p. [187]-197) and index.
ISBN:1281920495
1402093659 (Internet)
1402093659
9781281920492
9781402093654 (Internet)
9781402093654
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