Strain-induced effects in advanced MOSFETs / Viktor Sverdlov.

"Strain is used to boost performance of MOSFETs. Modeling of strain effects on transport is an important task of modern simulation tools required for device design. The book covers all relevant modeling approaches used to describe strain in silicon. The subband structure in stressed semiconduct...

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Bibliographic Details
Main Author: Sverdlov, Viktor (Author)
Format: Ebook
Language:English
Published: Wien : Springer, [2011]
Series:Computational microelectronics.
Subjects:
Online Access:Springer eBooks
Description
Summary:"Strain is used to boost performance of MOSFETs. Modeling of strain effects on transport is an important task of modern simulation tools required for device design. The book covers all relevant modeling approaches used to describe strain in silicon. The subband structure in stressed semiconductor films is investigated in devices using analytical k.p and numerical pseudopotential methods. A rigorous overview of transport modeling in strained devices is given."--Publisher's website.
Physical Description:1 online resource (xiv, 252 pages).
Bibliography:Includes bibliographical references and index.
ISBN:3709103819
9783709103814
1283084392
9781283084390
3709103827
9783709103821
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