X-ray line profile analysis in materials science / Jenő Gubicza, Eötvös Loránd University , Hungary.

"X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.X-Ray Line Profile Analysi...

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Bibliographic Details
Main Author: Gubicza, Jeno, 1969- (Author)
Format: Ebook
Language:English
Published: Hershey, PA : Engineering Science Reference, an imprint of IGI global, [2014]
Series:Research essentials.
Subjects:
Online Access:IGI Global e-Book Collection
Description
Summary:"X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students."--Publisher's website.
Physical Description:1 online resource (xvi, 343 pages) : illustrations.
Format:Mode of access: World Wide Web.
Bibliography:Includes bibliographical references and index.
ISBN:1466658533
1466658541
9781466658530
9781466658547
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