Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.
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| Main Authors: | , , |
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| Format: | Ebook |
| Language: | English |
| Published: |
Hoboken, New Jersey ; London, England :
John Wiley & Sons, Incorporated : ISTE Ltd.,
[2021]
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| Subjects: | |
| Online Access: | Click here to view this book |
| Physical Description: | 1 online resource (279 pages) : illustrations |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 1119818966 9781119818960 |