Advanced methods in automatic item generation / Mark J. Gierl, Hollis Lai, and Vasily Tanygin.

"Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today's technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and internet use, assessme...

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Bibliographic Details
Main Authors: Gierl, Mark J. (Author), Lai, Hollis (Author), Tanygin, Vasily (Author)
Format: Ebook
Language:English
Published: New York, NY : Routledge, 2021.
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Online Access:Click here to view this book
Description
Summary:"Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today's technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and internet use, assessment stakeholders-from graduate students to scholars to industry professionals-have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG as well as the practical considerations required to produce and apply large numbers of useful test items"--
Physical Description:1 online resource : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:1000377962
9781000377965
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